#\#CIF_1.1

#  CIF produced by WinGX routine CIF_UPDATE
#  Created on 2023-08-01 at 18:35:47
#  Using CIFtbx version 3.0.4  1 Sep 2006

#  Dictionary name : cif_core.dic
#  Dictionary vers : 2.4.5
#  Request file    : c:\program files (x86)\wingx\files\archive.reqdat
#  CIF files read  : shelx project

#------------------ SECTION 1. GLOBAL INFORMATION ---------------------------#

data_global

#------------------ AUDIT DETAILS -------------------------------------------#

_audit_creation_date            2023-08-01
_audit_creation_method          'WinGX routine CIF_UPDATE'
_audit_conform_dict_name        cif_core.dic
_audit_conform_dict_version     2.4.3
_audit_conform_dict_location    ftp://ftp.iucr.org/pub/cif_core.dic
_audit_update_record            ?

#------------------ AUTHOR DETAILS -------------------------------------------#

# Name and address of author for correspondence

_publ_contact_author_name       ' ,  '
_publ_contact_author_address
;

;
_publ_contact_author_email       ' '
_publ_contact_author_fax         ' '
_publ_contact_author_phone       ' '


# Insert blank lines between references

_publ_section_references
;
Blessing, R. H. (1995) Acta Cryst., A51, 33-38.

Blessing, R. H. (1987) Cryst. Rev. 1, 3-58.

Blessing, R. H. (1989) J. Appl. Cryst. 22, 396-397.

Bruker (2012) APEX2 (Version 2012.10-0), SAINT (version 8.27B), SADABS
(version 2012/1), BrukerAXS Inc, Madison, Wisconsin, USA.

ABSCOR: Higashi, T. (1995). ABSCOR. Rigaku Corporation, Tokyo, Japan.

CAD-4 Software: Enraf-Nonius (1989). CAD-4 Software (or CAD-4 EXPRESS).
Enraf-Nonius, Delft, The Netherlands.

Cambridge Structural Database: Allen, F. R. (2002). Acta Cryst. B58, 380-388.

CAMERON: Watkin, D. J., Prout, C. K. & Pearce, L. J. (1996). CAMERON.
Chemical Crystallography Laboratory, Oxford, England.

CrysAlis CCD, CrysAlis RED and associated programs: Oxford Diffraction (2006).
Program name(s). Oxford Diffraction Ltd, Abingdon, England.

CRYSTALS: Betteridge, P. W., Carruthers, J. R., Cooper, R. I., Prout, K. &
Watkin, D. J. (2003). J. Appl. Cryst. 36, 1487.

COLLECT: Nonius (1998). COLLECT. Nonius BV, Delft, The Netherlands.

DENZO/SCALEPACK:  Otwinowski, Z. & Minor, W. (1997). Methods in Enzymology,
Vol. 276, Macromolecular Crystallography, Part A, edited by C. W. Carter Jr
& R. M. Sweet, pp. 307-326. New York: Academic Press.

DIAMOND: Brandenburg, K.(2006). DIAMOND. Crystal Impact GbR, Bonn, Germany.

DIF4 and REDU4: Stoe & Cie (1991). Program name(s). Stoe & Cie, Darmstadt,
Germany.

DIFABS: Walker, N. &  Stuart, D. (1983). Acta Cryst., A39, 158 - 166.

DIRAX: Duisenberg, A. J. M. (1992). J. Appl. Cryst. 25, 92-96.

DIRDIF-2008: Beurskens, P.T., Beurskens, G., de Gelder, R., Garciía-Granda,
S., Gould, R.O. & Smits, J.M.M. (2008) The DIRDIF-2008 program
system, Crystallography Laboratory, Radboud University  Nijmegen,
The Netherlands.

EDMA: Palatinus, L., Prathapa, S. J. & van Smaalen, S. (2012) J. Appl. Cryst.
45, 575-580.

enCIFer: Allen, F. H., Johnson, O., Shields, G. P., Smith, B. R. & Towler,
M. (2004). J. Appl. Cryst. 37, 335-338.

EVALCCD: Duisenberg, A. J. M., Kroon-Batenburg, L. M. J. & Schreurs,
A. M. M. (2003). J. Appl. Cryst. 36, 220-229.

JANA2000: Petricek, V. & Dusek, M. (2000). JANA2000. Institute of Physics,
Czech Academy of Sciences, Prague, Czech Republic.

MERCURY: Macrae, C. F., Bruno, I. J., Chisholm, J. A., Edgington,
P. R., McCabe, P., Pidcock, E., Rodriguez-Monge, L., Taylor, R.,
van de Streek, J. & Wood, P. A. (2008). J. Appl. Cryst. 41, 466-470.

MOGUL: Bruno, I. J., Cole, J. C., Kessler, M., Luo, J., Motherwell,
W. D. S., Purkis, L. H., Smith, B. R., Taylor, R., Cooper, R. I., Harris,
S. E. & Orpen, A. G. (2004). J. Chem. Inf. Comput. Sci. 44, 2133-2144.

ORTEPII: Johnson, C. K. (1976). ORTEPII. Report ORNL-5138. Oak Ridge
National Laboratory, Tennessee, USA.

ORTEPIII:  Burnett, M. N. & Johnson, C. K. (1996). ORTEPIII.
Report ORNL-6895. Oak Ridge National Laboratory, Tennessee, USA.

ORTEP-3: Farrugia, L. J. (2012). J. Appl. Cryst. 45, 849-854.

PARST: Nardelli, M. (1995). J. Appl. Cryst. 28, 659.

PLATON: Spek, A. L. (2009). Acta. Cryst. D65, 148-155.

PROCESS: Rigaku (1996). PROCESS. Rigaku Corporation, Tokyo, Japan.

PROCESS-AUTO: Rigaku (1998). PROCESS-AUTO. Rigaku Corporation, Tokyo, Japan.

PublCIF: Westrip, S. P. (2010). J. Appl. Cryst. 43, 920-925.

SCHAKAL: Keller, E. (1999) University of Freiburg, Germany.

SHELX: Sheldrick, G. M. (2015). Acta Cryst. C71, 3-8.

SHELXD: Schneider, T. R. & Sheldrick, G. M. (2002) Acta Cryst. D58, 1772-1779.

SHELXT: Sheldrick, G. M. (2015). Acta Cryst. A71, 3-8.

SIR92: Altomare, A., Cascarano, G., Giacovazzo, C., Guagliardi, A., Burla,
M. C., Polidori, G. & Camalli, M. (1994). J. Appl. Cryst. 27, 435.

SIR97: Altomare, A., Burla, M. C., Camalli, M., Cascarano, G. L.,
Giacovazzo, C., Guagliardi, A., Moliterni, A. G. G., Polidori, G. &
Spagna, R. (1999). J. Appl. Cryst. 32, 115-119.

SIR2002: Burla, M. C., Camalli, M., Carrozzini, B., Cascarano, G. L.,
Giacovazzo, C., Polidori, G. & Spagna, R. (2003). J. Appl. Cryst. 36, 1103.

SIR2004: Burla, M. C., Caliandro, R., Camalli, M., Carrozzini, B.,
Cascarano, G. L., De Caro, L., Giacovazzo, C., Polidori, G. & Spagna, R.
(2005). J. Appl. Cryst. 38, 381-388.

SIR2008 & IL MILIONE: Burla, M. C., Caliandro, R., Camalli, M., Carrozzini, B.,
Cascarano, G. L., De Caro, L., Giacovazzo, C., Polidori, G., Siliqi, D.,
& Spagna, R. (2007). J. Appl. Cryst. 40, 609-613.

SIR2011: Burla, M. C., Caliandro, R., Camalli, M., Carrozzini, B.,
Cascarano, G. L., Giacovazzo, C., Mallamo, M., Mazzone, A., Polidori, G.
& Spagna, R. (2012). J. Appl. Cryst. 45, 357-361.

SUPERFLIP: Palatinus, L. & Chapuis, G. (2007) J. Appl. Cryst. 40, 786-790.

TEXSAN: Molecular Structure Corporation & Rigaku (2000). TEXSAN. MSC,
The Woodlands, Texas, USA, and Rigaku Corporation, Tokyo, Japan.

WinGX: Farrugia, L. J. (2012). J. Appl. Cryst. 45, 849-854.

X-AREA, X-RED, X-RED32, X-SHAPE:  Stoe & Cie (2002). Program name(s).
Stoe & Cie GmbH, Darmstadt, Germany.

XCAD4: Harms, K. & Wocadlo, S. (1995). XCAD4. University of Marburg, Germany.

XSCANS: Siemens (1994). XSCANS. Siemens Analytical X-ray Instruments Inc.,
Madison, Wisconsin, USA.

;

#------------------  SECTION 2. COMPOUND(S) DETAILS -------------------------#

data_shelx

_audit_creation_date                    2023-08-01T18:35:47-00:00
_audit_creation_method                  'WinGX routine CIF_UPDATE'
_audit_conform_dict_name                cif_core.dic
_audit_conform_dict_version             2.4.5
_audit_conform_dict_location            ftp://ftp.iucr.org/pub/cif_core.dic
_publ_requested_category                FI

#----------------------------------------------------------------------------#
#                   CHEMICAL INFORMATION                                     #
#----------------------------------------------------------------------------#

_chemical_formula_sum                   'Cr P2 S7 Tl'
_chemical_formula_weight                542.73
_chemical_absolute_configuration        unk

#----------------------------------------------------------------------------#
#                   UNIT CELL INFORMATION                                    #
#----------------------------------------------------------------------------#

_symmetry_cell_setting                  orthorhombic
_symmetry_space_group_name_H-M          'C 2 2 21'
_symmetry_space_group_name_Hall         'C 2c 2'
_symmetry_Int_Tables_number             20
loop_
    _symmetry_equiv_pos_as_xyz
'x, y, z'
'-x, -y, z+1/2'
'-x, y, -z+1/2'
'x, -y, -z'
'x+1/2, y+1/2, z'
'-x+1/2, -y+1/2, z+1/2'
'-x+1/2, y+1/2, -z+1/2'
'x+1/2, -y+1/2, -z'

_cell_length_a                          8.4944(6)
_cell_length_b                          9.5392(8)
_cell_length_c                          12.3875(8)
_cell_angle_alpha                       90
_cell_angle_beta                        90
_cell_angle_gamma                       90
_cell_volume                            1003.76(13)
_cell_formula_units_Z                   4
_cell_measurement_temperature           353(2)
_cell_measurement_reflns_used           15426
_cell_measurement_theta_min             2.91
_cell_measurement_theta_max             27.48
_cell_measurement_wavelength            0.71073

#----------------------------------------------------------------------------#
#                   CRYSTAL INFORMATION                                      #
#----------------------------------------------------------------------------#

_exptl_crystal_description              plate
_exptl_crystal_colour                   dark
_exptl_crystal_size_max                 0.13
_exptl_crystal_size_mid                 0.114
_exptl_crystal_size_min                 0.024
_exptl_crystal_density_diffrn           3.591
_exptl_crystal_density_method           'not measured'
_exptl_crystal_F_000                    988
loop_
    _exptl_crystal_face_index_h
    _exptl_crystal_face_index_k
    _exptl_crystal_face_index_l
    _exptl_crystal_face_perp_dist
1 1 0 0.057
-1 -1 0 0.057
1 -1 0 0.065
-1 1 0 0.065
0 0 1 0.012
0 0 -1 0.012
0 1 0 0.068
0 -1 0 0.056


#----------------------------------------------------------------------------#
#                   ABSORPTION CORRECTION                                    #
#----------------------------------------------------------------------------#

_exptl_absorpt_coefficient_mu           18.819
_exptl_absorpt_correction_type          multi-scan
_exptl_absorpt_process_details
;
        [c.f. r.h. blessing, acta cryst. (1995), a51, 33-38]
;
_exptl_absorpt_correction_T_min         0.2304
_exptl_absorpt_correction_T_max         0.5013
_shelx_estimated_absorpt_T_min          0.193
_shelx_estimated_absorpt_T_max          0.661

#----------------------------------------------------------------------------#
#                   DATA COLLECTION                                          #
#----------------------------------------------------------------------------#

_diffrn_source                          'Enraf Nonius FR590'
_diffrn_ambient_temperature             353(2)
_diffrn_radiation_wavelength            0.71073
_diffrn_radiation_type                  MoK\a
_diffrn_radiation_monochromator         'horizonally mounted graphite crystal'
_diffrn_radiation_probe                 x-ray
_diffrn_detector                        'CCD plate'
_diffrn_detector_area_resol_mean        9
_diffrn_orient_matrix_ub_11             0.081384
_diffrn_orient_matrix_ub_12             0.059003
_diffrn_orient_matrix_ub_13             0.036577
_diffrn_orient_matrix_ub_21             0.01763
_diffrn_orient_matrix_ub_22             -0.076009
_diffrn_orient_matrix_ub_23             0.054265
_diffrn_orient_matrix_ub_31             0.083216
_diffrn_orient_matrix_ub_32             -0.041602
_diffrn_orient_matrix_ub_33             -0.047268
_diffrn_measurement_device              '95mm CCD camera on κ-goniostat'
_diffrn_measurement_device_type         KappaCCD
_diffrn_measurement_method              'CCD rotation images, thick slices'
_diffrn_standards_number                0
_diffrn_standards_interval_time         .
_diffrn_standards_interval_count        .
_diffrn_standards_decay_%               ?
_diffrn_reflns_av_R_equivalents         0.1375
_diffrn_reflns_av_unetI/netI            0.0976
_diffrn_reflns_number                   4147
_diffrn_reflns_limit_h_min              -11
_diffrn_reflns_limit_h_max              11
_diffrn_reflns_limit_k_min              -12
_diffrn_reflns_limit_k_max              12
_diffrn_reflns_limit_l_min              -16
_diffrn_reflns_limit_l_max              16
_diffrn_reflns_theta_min                3.211
_diffrn_reflns_theta_max                27.514
_diffrn_reflns_theta_full               25.242
_diffrn_measured_fraction_theta_full
                                        0.985
_diffrn_measured_fraction_theta_max
                                        0.974
_diffrn_reflns_Laue_measured_fraction_full
                                        0.985
_diffrn_reflns_Laue_measured_fraction_max
                                        0.974
_diffrn_reflns_point_group_measured_fraction_full
                                        0.975
_diffrn_reflns_point_group_measured_fraction_max
                                        0.955
_reflns_Friedel_fraction_full           0.96
_reflns_Friedel_fraction_max            0.929
_reflns_Friedel_coverage                0.677
_reflns_number_total                    1110
_reflns_number_gt                       784
_reflns_threshold_expression            'I > 2σ(I)'

#----------------------------------------------------------------------------#
#                   COMPUTER PROGRAMS USED                                   #
#----------------------------------------------------------------------------#

_computing_data_collection              'Collect (Bruker AXS BV, 1997-2004)'
_computing_cell_refinement
                                       'HKL Scalepack (Otwinowski & Minor 1997)'
_computing_data_reduction
                             'HKL Denzo and Scalepack (Otwinowski & Minor 1997)'
_computing_structure_refinement         'SHELXL-2018/3 (Sheldrick, 2018)'
_computing_molecular_graphics           'Ortep for Windows (Farrugia, 2012)'
_computing_publication_material
                                   'WinGX publication routines (Farrugia, 2012)'

#----------------------------------------------------------------------------#
#                   STRUCTURE SOLUTION                                       #
#----------------------------------------------------------------------------#


#----------------------------------------------------------------------------#
#                   REFINEMENT INFORMATION                                   #
#----------------------------------------------------------------------------#

_shelx_SHELXL_version_number            2018/3
_refine_ls_structure_factor_coef        Fsqd
_refine_ls_matrix_type                  full
_refine_ls_weighting_scheme             calc
_refine_ls_weighting_details
                      'w=1/[σ²(Fo²)+(0.1240P)²] where P=(Fo²+2Fc²)/3'
_refine_ls_hydrogen_treatment           undef
_refine_ls_extinction_method            'SHELXL-2018/3 (Sheldrick 2018)'
_refine_ls_extinction_expression
                                    Fc^*^=kFc[1+0.001xFc²λ³/sin(2θ)]^-1/4^
_refine_ls_extinction_coef              0.0029(13)
_refine_ls_number_reflns                1110
_refine_ls_number_parameters            53
_refine_ls_number_restraints            0
_refine_ls_number_constraints           0
_refine_ls_R_factor_all                 0.1039
_refine_ls_R_factor_gt                  0.0761
_refine_ls_wR_factor_ref                0.2089
_refine_ls_wR_factor_gt                 0.1857
_refine_ls_goodness_of_fit_ref          1.061
_refine_ls_restrained_S_all             1.061
_refine_ls_shift/su_max                 0
_refine_ls_shift/su_mean                0
_refine_ls_abs_structure_details
;
 Flack x determined using 238 quotients [(I+)-(I-)]/[(I+)+(I-)]
 (Parsons, Flack and Wagner, Acta Cryst. B69 (2013) 249-259).
;
_refine_ls_abs_structure_Flack          -0.013(13)
_refine_diff_density_max                2.399
_refine_diff_density_min                -3.057
_refine_diff_density_rms                0.402

#----------------------------------------------------------------------------#
#                   CONSTRAINTS AND RESTRAINTS                               #
#----------------------------------------------------------------------------#


#----------------------------------------------------------------------------#
#                   ATOMIC TYPES, COORDINATES AND THERMAL PARAMETERS         #
#----------------------------------------------------------------------------#

loop_
    _atom_type_symbol
    _atom_type_description
    _atom_type_scat_dispersion_real
    _atom_type_scat_dispersion_imag
    _atom_type_scat_source
Cr Cr 0.3209 0.6236 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4'
P P 0.1023 0.0942 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4'
S S 0.1246 0.1234 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4'
Tl Tl -2.8358 9.6688 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4'

loop_
    _atom_site_label
    _atom_site_type_symbol
    _atom_site_fract_x
    _atom_site_fract_y
    _atom_site_fract_z
    _atom_site_U_iso_or_equiv
    _atom_site_adp_type
    _atom_site_occupancy
    _atom_site_site_symmetry_order
    _atom_site_calc_flag
    _atom_site_refinement_flags_posn
    _atom_site_refinement_flags_adp
    _atom_site_refinement_flags_occupancy
    _atom_site_disorder_assembly
    _atom_site_disorder_group
Tl1 Tl 0.4355(2) 0.5 0.5 0.0989(12) Uani 1 2 d S T P . .
Cr1 Cr 0.5 0.9049(5) 0.25 0.0272(11) Uani 1 2 d S T P . .
P1 P 0.1936(5) 0.7537(6) 0.2916(5) 0.0290(12) Uani 1 1 d . . . . .
S1 S 0.3130(5) 0.8785(6) 0.3942(4) 0.0311(12) Uani 1 1 d . . . . .
S2 S 0.3346(6) 0.7333(6) 0.1609(5) 0.0363(13) Uani 1 1 d . . . . .
S3 S 0.1193(6) 0.5793(6) 0.3664(5) 0.0345(13) Uani 1 1 d . . . . .
S4 S 0 0.8858(8) 0.25 0.0390(19) Uani 1 2 d S T P . .

loop_
    _atom_site_aniso_label
    _atom_site_aniso_U_11
    _atom_site_aniso_U_22
    _atom_site_aniso_U_33
    _atom_site_aniso_U_23
    _atom_site_aniso_U_13
    _atom_site_aniso_U_12
Tl1 0.0573(11) 0.177(3) 0.0626(13) 0.0144(16) 0 0
Cr1 0.0186(18) 0.028(3) 0.035(2) 0 0.0009(17) 0
P1 0.022(2) 0.028(3) 0.036(3) 0.000(2) -0.0010(19) -0.001(2)
S1 0.024(2) 0.032(3) 0.037(3) -0.006(2) 0.002(2) -0.006(2)
S2 0.034(3) 0.037(3) 0.039(3) -0.009(2) 0.006(2) -0.007(2)
S3 0.035(3) 0.027(3) 0.042(3) 0.003(2) -0.006(2) -0.013(2)
S4 0.025(3) 0.028(4) 0.063(5) 0 -0.010(3) 0


#----------------------------------------------------------------------------#
#                   MOLECULAR GEOMETRY                                       #
#----------------------------------------------------------------------------#

_geom_special_details
;
 All esds (except the esd in the dihedral angle between two l.s. planes)
 are estimated using the full covariance matrix.  The cell esds are taken
 into account individually in the estimation of esds in distances, angles
 and torsion angles; correlations between esds in cell parameters are only
 used when they are defined by crystal symmetry.  An approximate (isotropic)
 treatment of cell esds is used for estimating esds involving l.s. planes.
;
loop_
    _geom_bond_atom_site_label_1
    _geom_bond_atom_site_label_2
    _geom_bond_distance
    _geom_bond_site_symmetry_2
    _geom_bond_publ_flag
Cr1 S1 2.403(5) . ?
Cr1 S1 2.403(5) 3_655 ?
Cr1 S2 2.423(6) . ?
Cr1 S2 2.423(6) 3_655 ?
Cr1 S3 2.424(6) 5 ?
Cr1 S3 2.424(6) 7 ?
P1 S3 2.007(7) . ?
P1 S1 2.015(7) . ?
P1 S2 2.023(8) . ?
P1 S4 2.135(7) . ?

loop_
    _geom_angle_atom_site_label_1
    _geom_angle_atom_site_label_2
    _geom_angle_atom_site_label_3
    _geom_angle
    _geom_angle_site_symmetry_1
    _geom_angle_site_symmetry_3
    _geom_angle_publ_flag
S1 Cr1 S1 167.9(3) . 3_655 ?
S1 Cr1 S2 83.35(19) . . ?
S1 Cr1 S2 88.5(2) 3_655 . ?
S1 Cr1 S2 88.5(2) . 3_655 ?
S1 Cr1 S2 83.35(19) 3_655 3_655 ?
S2 Cr1 S2 95.0(3) . 3_655 ?
S1 Cr1 S3 84.62(19) . 5 ?
S1 Cr1 S3 103.8(2) 3_655 5 ?
S2 Cr1 S3 167.71(18) . 5 ?
S2 Cr1 S3 87.1(2) 3_655 5 ?
S1 Cr1 S3 103.8(2) . 7 ?
S1 Cr1 S3 84.62(19) 3_655 7 ?
S2 Cr1 S3 87.1(2) . 7 ?
S2 Cr1 S3 167.71(18) 3_655 7 ?
S3 Cr1 S3 93.3(3) 5 7 ?
S3 P1 S1 110.9(3) . . ?
S3 P1 S2 118.4(3) . . ?
S1 P1 S2 105.3(3) . . ?
S3 P1 S4 111.0(3) . . ?
S1 P1 S4 101.0(3) . . ?
S2 P1 S4 108.7(3) . . ?
P1 S1 Cr1 85.8(2) . . ?
P1 S2 Cr1 85.1(2) . . ?
P1 S3 Cr1 115.2(3) . 5_445 ?
P1 S4 P1 107.6(4) 3 . ?

_iucr_refine_instructions_details
;
TITL shelxt_a.res in C222(1)
    shelx.res
    created by SHELXL-2018/3 at 18:34:59 on 01-Aug-2023
CELL  0.71073   8.4944   9.5392  12.3875   90.000   90.000   90.000
ZERR     4.00   0.0006   0.0008   0.0008    0.000    0.000    0.000
LATT  -7
SYMM  - X, - Y, 1/2 + Z
SYMM  - X,   Y, 1/2 - Z
SYMM    X, - Y, - Z
SFAC  CR   P    S    TL
UNIT  4 8 28 4
TEMP 80
SIZE 0.024 0.114 0.13
MERG   2
FMAP   2
PLAN   20
ACTA
BOND
LIST   4
L.S.  10
WGHT    0.124000
EXTI    0.002880
FVAR       0.11364
TL1   4    0.435465    0.500000    0.500000    10.50000    0.05728    0.17683 =
         0.06257    0.01444    0.00000    0.00000
CR1   1    0.500000    0.904902    0.250000    10.50000    0.01860    0.02810 =
         0.03494    0.00000    0.00087    0.00000
P1    2    0.193571    0.753731    0.291564    11.00000    0.02242    0.02846 =
         0.03611    0.00034   -0.00099   -0.00057
S1    3    0.312982    0.878453    0.394161    11.00000    0.02375    0.03209 =
         0.03737   -0.00566    0.00244   -0.00603
S2    3    0.334596    0.733342    0.160937    11.00000    0.03368    0.03678 =
         0.03850   -0.00850    0.00570   -0.00733
S3    3    0.119292    0.579266    0.366426    11.00000    0.03476    0.02715 =
         0.04156    0.00317   -0.00635   -0.01257
S4    3    0.000000    0.885821    0.250000    10.50000    0.02550    0.02840 =
         0.06298    0.00000   -0.00976    0.00000
HKLF    4




REM  shelxt_a.res in C222(1)
REM wR2 = 0.2089, GooF = S = 1.061, Restrained GooF = 1.061 for all data
REM R1 = 0.0761 for 784 Fo > 4sig(Fo) and 0.1039 for all 1110 data
REM 53 parameters refined using 0 restraints

END

WGHT      0.1240      0.0000

REM Highest difference peak  2.399,  deepest hole -3.057,  1-sigma level  0.402
Q1    1   0.4380  0.4955  0.5772  11.00000  0.05    2.40
Q2    1   0.4087  0.5636  0.5153  11.00000  0.05    1.69
Q3    1   0.1985  0.7611  0.3600  11.00000  0.05    1.49
Q4    1   0.5179  0.9041  0.1802  11.00000  0.05    1.26
Q5    1   0.3298  0.7306  0.2199  11.00000  0.05    1.21
Q6    1   0.0939  0.5814  0.2802  11.00000  0.05    1.17
Q7    1   0.3254  0.7233  0.0850  11.00000  0.05    0.95
Q8    1   0.2547  0.6650  0.3626  11.00000  0.05    0.91
Q9    1   0.5040  0.9064  0.3941  11.00000  0.05    0.91
Q10   1   0.2123  0.6328  0.1518  11.00000  0.05    0.89
Q11   1   0.2206  0.6923  0.3841  11.00000  0.05    0.88
Q12   1   0.1977  0.7204  0.2295  11.00000  0.05    0.88
Q13   1   0.0000  1.0769  0.2500  10.50000  0.05    0.84
Q14   1   0.0991  0.9326  0.1676  11.00000  0.05    0.84
Q15   1   0.0726  0.7057  0.2278  11.00000  0.05    0.76
Q16   1   0.3155  0.6227  0.3892  11.00000  0.05    0.74
Q17   1   0.2065  1.0004  0.4680  11.00000  0.05    0.73
Q18   1   0.3059  0.8784  0.4621  11.00000  0.05    0.72
Q19   1   0.1830  0.6501  0.2821  11.00000  0.05    0.72
Q20   1   0.3048  0.8828  0.3398  11.00000  0.05    0.69
;

# END of CIF
